METHOD OF DETERMINATION OF INTERNAL PROFILE OF CONCENTRATION OF CHARGE CARRIERS IN SEMICONDUCTOR COMPOUNDS,申请号PL19810233209-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	METHOD OF DETERMINATION OF INTERNAL PROFILE OF CONCENTRATION OF CHARGE CARRIERS IN SEMICONDUCTOR COMPOUNDS
摘要
申请公布号	PL134300(B1)	申请公布日期	1985.08.31
申请号	PL19810233209	申请日期	1981.09.28
申请人		发明人
分类号	G01R;G01R31/26;(IPC1-7):G01R31/26	主分类号	G01R
代理机构		代理人
主权项
地址

您可能感兴趣的专利

LAAS FOR HAANDBREMSVEKTSTANG I KJOERETOEY.

POROES KERAMISK GENSTAND

CONTROL METHOD FOR PUMP FOR HIGH VISCOUS MATERIAL

HEATING DEVICE FOR THERMAL CONDUCTIVITY DETECTOR

THROTTLE VALVE OPENING DEGREE CONTROL DEVICE

FUEL GAS SYSTEM

VALVE MOVING DEVICE FOR AUTOMOBILE ENGINE

METHOD FOR DRIVING DOFFER IN CARDING

REACTION VESSEL

DETECTION OF HEAT BUCKLE OF STEEL SHEET TRAVELING IN CONTINUOUS ANNEALING FURNACE

HEATING FURNACE DEVICE

REACTION FURNACE FOR SMELTING

METHOD AND APPARATUS FOR SUPPLYING METALLIC ION IN ELECTROPLATING

SURFACE TREATMENT DEVICE

THIN FILM FORMING DEVICE

PCM RECORDING AND REPRODUCING DEVICE

HOT AIR FLOW SPACE HEATER

FLOPPY DISK DEVICE

GAS IGNITION DEVICE