发明名称 Single grid focussed ion beam source
摘要 A technique for providing an ion beam of variable focussing (concentration) is described using a flexible grid for extracting and accelerating ions from an ion plasma. The grid is electrically conducting and will bow depending on a voltage difference between it and the ion plasma. This bowing of the grid from its initial planar configuration provides focussing of the ion beam. The amount of focussing depends upon the amount the grid is bowed, which in turn depends upon the voltage difference between it and the ion plasma. The same ion source/flexible grid combination can be used for different operations as for example, providing a collimated, low energy ion beam over a large area and then for providing a focussed ion beam of high energy onto a small area.
申请公布号 US4538067(A) 申请公布日期 1985.08.27
申请号 US19820448122 申请日期 1982.12.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CUOMO, JEROME J.;HARPER, JAMES M. E.;WATERS, GARY A.
分类号 C23F4/00;C23C14/46;H01J27/02;H01J27/08;H01J37/08;H01J37/305;H01J37/317;H01L21/265;H01L21/302;(IPC1-7):H01J3/14 主分类号 C23F4/00
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