发明名称 CMOS process for fabricating integrated circuits, particularly dynamic memory cells with storage capacitors
摘要 A CMOS process is described which is particularly suited for forming dynamic memory cells. The cells are formed in an n-well and a single plate member formed from a first layer of polysilicon is used for the entire array. Unique etching of the first polysilicon layer prevents stringers from occurring when the second layer of polysilicon is deposited. A tri-layer dielectric is used for the capacitors in the array. Novel "rear-end" processing is disclosed using a phosphorus doped glass.
申请公布号 US4536947(A) 申请公布日期 1985.08.27
申请号 US19840627061 申请日期 1984.07.02
申请人 INTEL CORPORATION 发明人 BOHR, MARK T.;YU, KEN K.;YAU, LEO D.;GARG, SHYAM G.
分类号 H01L21/8238;H01L21/8242;H01L27/108;(IPC1-7):H01L21/306;H01L21/31 主分类号 H01L21/8238
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