发明名称 In-circuit test apparatus for printed circuit board
摘要 An in-circuit test apparatus having a vacuum chamber between a top plate and a base plate. The apparatus has an adjustable bearing block assembly located at each quandrant to provide a precision alignment between the top plate and the base plate. A continuous double-hollow tube is located in a uniform groove in the base plate and forms a seal when held captive between the top plate and the base plate. A plurality of spring probe pressure pins are mounted within the chamber. The pins project through drilled individual access ports in the top plate and make electrical contact with a printed circuit board under test when the top plate collapses under a vacuum.
申请公布号 US4538104(A) 申请公布日期 1985.08.27
申请号 US19830483696 申请日期 1983.04.11
申请人 TEST POINT 1, INC. 发明人 DOUGLAS, BRUCE S.;WESTERGART, CHESTER V.
分类号 G01R1/073;(IPC1-7):G01R31/02 主分类号 G01R1/073
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