发明名称 PROTECTING METHOD FOR COMPOUND SEMICONDUCTOR IN HIGH TEMPERATURE HEAT TREATMENT
摘要 PURPOSE:To enable a vapor pressure equilibrium or protection plate itself in a gap between a compound semiconductor to be processed and the protection plate to function as an evaporation source, and to reduce the amount of loss due to evaporation without contamination with other substances, by a method wherein said compound semiconductor is supported by the protection plate of the same kind of material as that of this semiconductor. CONSTITUTION:In the wafer process for compound semiconductors, the manufacture of semiconductor devices, and the like, a substrate 1 to be processed is supported by the protection plate 2a of the same kind of material in its lower surface, and then covered with a similar protection plate 2b in its upper surface. Micro gaps 4a and 4b are formed between the substrate 1 to be processed and the protection plate 2a or 2b in the presence of projections 3 (here triangular in cross-section) which belong to the protection plate. In this state, the whole is housed in a heat treatment case 5 and tightly closed with a cap 6.
申请公布号 JPS60163440(A) 申请公布日期 1985.08.26
申请号 JP19840016979 申请日期 1984.02.03
申请人 SUMITOMO DENKI KOGYO KK 发明人 IWASAKI TAKASHI
分类号 H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/324
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