发明名称 INSPECTING APPARATUS FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To obviate mutual interference through a chuck for enabling a precise parallel measurement, by composing a chuck of a plurality of metallic blocks insulated electrically. CONSTITUTION:A wafer chuck 6 is divided into metallic blocks 4 which are electrically insulated. Therefore, IC pellets 2 are substantially prevented from mutual interference, and can be tested precisely. Thus, according to this invention, a plurality of ICs can be stably measured in parallel.
申请公布号 JPS60160630(A) 申请公布日期 1985.08.22
申请号 JP19840016406 申请日期 1984.01.31
申请人 NIPPON DENKI KK 发明人 OZAWA MASAHIDE
分类号 G01R1/073;H01L21/66 主分类号 G01R1/073
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