发明名称 CORRECTION CIRCUIT SYSTEM FOR ERROR OR DEFECTIVE PART OF MEMORY
摘要 <p>PURPOSE:To utilize the part of nondefective memory element and to improve the countermeasure performance to the detects produced after shipment, by providing an element which stores the addresses and data requiring corrections separately from the defective part of the memory element. CONSTITUTION:When a nondefective one of address signals A1-Ai is supplied, an address is selected by an address decoder AD1. Then the data written to a memory matrix MM1 is delivered out of a three-state output buffer OB1. While the block of a ROM II serving as a ROM element for correction inhibits the actuation of the defective area of a ROM I and transmits the normal data. Therefore the part corresponding to the defective area of the ROM I is programmed to the part of an address decoder AD2 of the ROM II as sell as to the part of a memory matrix MM2 respectively.</p>
申请公布号 JPS60160100(A) 申请公布日期 1985.08.21
申请号 JP19840016767 申请日期 1984.01.30
申请人 SHARP KK 发明人 TANIGUCHI KOUKI
分类号 G11C11/413;G06F11/00;G11C17/00;G11C29/00;G11C29/04;G11C29/24 主分类号 G11C11/413
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