发明名称 INSPECTION DEVICE FOR CIRCUIT SUBSTRATE AND THE LIKE
摘要 PURPOSE:To enable to replace at least a part of a plurality of probe groups as well as to simplify the replacement work of the probe groups by a method wherein a probe unit is pinched between two supporting plates in such a manner that its upper and the lower terminal parts are engaged with the stepped part of a stepped hole, and a coupling member is interposed between said supporting plates. CONSTITUTION:When the change of the probe arrangement of a probe unit 4 is required, the upper supporting plate 1 and the lower supporting plate 2 are separated by removing the coupling members 3 located at the four corners of supporting plates 1 and 2. The probe unit 4 to be changed is replaced by new probe unit 4 having other probe arrangement, and the supporting plates 1 and 2 are coupled in one body using a coupling member 3 by conducting an operation reverse to the above-mentioned procedure. Also, as each probe unit 4 is fixed in a pinched manner between the supporting plates 1 and 2 and it can be mounted, dismounted and replaced simultaneously by releasing the coupling of the supporting plates 1 and 2, a replacement work can be performed easily when compared with the case where the probe unit 4 is detachably mounted on the supporting plates 1 and 2 using a separate fixing device for each probe unit.
申请公布号 JPS60142530(A) 申请公布日期 1985.07.27
申请号 JP19830250155 申请日期 1983.12.28
申请人 YOKOO SEISAKUSHO:KK 发明人 NAKAJIMA KOU;SAIDA KATSUTOSHI
分类号 G01R31/26;G01R1/04;H01L21/66 主分类号 G01R31/26
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