发明名称 DIAGNOSTIC DEVICE OF TESTING SHIFT PATH
摘要 PURPOSE:To detect which FF is faulty, too, by connecting an FF of a testing shift path to a selector, and controlling this selector from the outside. CONSTITUTION:A bit serial test signal is supplied to FFs 3a, 3b... for forming a shift path from a shift-in terminal 4, outputted from a shift-out terminal 5, and the shift path is diagnosed. These FFs 3a, 3b... are connected to a selector 10, and when the selector 10 is controlled by an external signal passing through an address register 15, the outputs of desired FFs 3a, 3b... are outputted to a selector output terminal 13, and which FF of 3a, 3b... is faulty can be detected.
申请公布号 JPS60142281(A) 申请公布日期 1985.07.27
申请号 JP19830249572 申请日期 1983.12.28
申请人 MITSUBISHI DENKI KK 发明人 SAKATA TAKEO
分类号 G01R31/28;G06F11/267;H03K19/00 主分类号 G01R31/28
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