发明名称 ION SOURCE DEVICE FOR DOPING
摘要 PURPOSE:To carry out high-concn. doping at low temps. by providing a combination of a lens for controlling the electric current and diameter of an ion beam, a mass separator for selecting ions, and a deflector to a titled ion source. CONSTITUTION:When an ion source 2 is electrically heated and a high voltage is impressed on a drawing electrode, an ion beam 6 of a eutectic metal is taken out. The electric current and diameter of the ion beam is controlled by an electrostatic lens 5, and only the desired ion is separated by a mass separator 5. The ion is further hit against a substrate 9 by a deflector 8 so that the ion may scan on the substrate 9. Accordingly, a high-purity dopant ion consisting only of the desired ion can be obtained, and the hundred-percent ionized particle can be doped in high concn. into a thin film growing on the substrate 9 by molecular beam epitaxial devices 10 and 11. In addition, the doping can be carried out without generating any segregation layers.
申请公布号 JPS60141699(A) 申请公布日期 1985.07.26
申请号 JP19830244919 申请日期 1983.12.27
申请人 NIPPON SHINKU GIJUTSU KK 发明人 KOMAGATA KAZUYUKI
分类号 C30B23/08;C30B31/22;H01L21/203 主分类号 C30B23/08
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