发明名称 METHOD AND APPARATUS FOR MEASURING FLAW DIMENSION BY ANALYSIS OF ULTRASONIC FREQUENCY
摘要 PURPOSE:To perform the measurement of a flaw dimension with good accuracy, by applying frequency analysis to the time difference of the surface echo and flaw echo from the surface of a material to be inspected. CONSTITUTION:When the ultrasonic oscillation pulse T from the vibrator 2 in a probe 1 is allowed to be incident to the surface of a material to be inspected, said pulse T is reflected not only from a flaw 4 to generate a flaw echo F but also from the surface 31 of the material to be inspected to generate a surface echo S and both echoes are received by a vibrator 2. Signals of the oscillation pulse T, the surface echo S and the flaw echo F are also inputted to an oscilloscope 8. The signals of the surface echo S and the flaw echo F are taken out from the signals inputted to a gate circuit 7 and the time different t2 of both echoes is processed by a frequency analyser 9. The signals from the circuit 7 are simultaneously inputted to an ultrasonic frequency interval measuring circuit 10 where the frequency interval of the max. value in a frequency spectrum is measured and a flaw dimension d1 is calculated by a flaw dimension operation circuit 11.
申请公布号 JPS61184455(A) 申请公布日期 1986.08.18
申请号 JP19850024902 申请日期 1985.02.12
申请人 POWER REACTOR & NUCLEAR FUEL DEV CORP 发明人 TANIMOTO KENICHI
分类号 G01N29/44;G01N29/04;G01N29/07;G01N29/38;G01N29/46 主分类号 G01N29/44
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