Method and apparatus for examining a gemstone to determine a parameter thereof. A thin beam of light is projected onto the stone, the beam is moved relative to the stone, the position where the beam strikes the stone is sensed in a direction different from that in which the beam is projected, and a parameter is determined making use of information derived from such sensing.
申请公布号
US4529305(A)
申请公布日期
1985.07.16
申请号
US19820395245
申请日期
1982.07.06
申请人
WELFORD, WALTER T.;STEWART, ANDREW D. G.;DODSON, JOHN S.
发明人
WELFORD, WALTER T.;STEWART, ANDREW D. G.;DODSON, JOHN S.