发明名称 Examining a gemstone
摘要 Method and apparatus for examining a gemstone to determine a parameter thereof. A thin beam of light is projected onto the stone, the beam is moved relative to the stone, the position where the beam strikes the stone is sensed in a direction different from that in which the beam is projected, and a parameter is determined making use of information derived from such sensing.
申请公布号 US4529305(A) 申请公布日期 1985.07.16
申请号 US19820395245 申请日期 1982.07.06
申请人 WELFORD, WALTER T.;STEWART, ANDREW D. G.;DODSON, JOHN S. 发明人 WELFORD, WALTER T.;STEWART, ANDREW D. G.;DODSON, JOHN S.
分类号 G01N21/87;(IPC1-7):G01N21/87 主分类号 G01N21/87
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