发明名称 FUNCTION-TRIMMING METHOD
摘要 <p>PURPOSE:To reduce the laser trimming time by trimming only by observation of a DC voltage value or current value in the function trimming of an integrated circuit. CONSTITUTION:The signal outputted from an input signal source 1 is outputted to an AC output observation device 5 through a signal processing circuit 3 in the integrated circuit 2. Therefore, while observing the waveform of the output signal, this device 5 varies the voltage impressed on a resistor 4 by a variable voltage source 10, and then a measurement circuit 11 measures a voltage whereby the output comes to a desired value, and stores it in a large-scaled tester 6. Next, the voltage observation of the resistor is performed after the observation of the output waveform of the IC2 is stopped, and thus trimming is accomplished until this voltage comes to the stored value.</p>
申请公布号 JPS60133747(A) 申请公布日期 1985.07.16
申请号 JP19830243256 申请日期 1983.12.21
申请人 MITSUBISHI DENKI KK 发明人 TOMURO YASUTA
分类号 H01C17/24;H01L27/01 主分类号 H01C17/24
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