发明名称 ELECTRON MICROSCOPE COMPRISING AN X-RAY DETECTOR
摘要 <p>"Electron microscope comprising an X-ray detector." A detector for measuring X-rays in an electron microscope comprises a shield which shields a detector entrance window against the incidence of electrons or not in accordance with the various measuring settings. The shield may be arranged to be movable under the influence of the magnetic field strength variation which occurs during the switching over between the various measuring settings.</p>
申请公布号 CA1190329(A) 申请公布日期 1985.07.09
申请号 CA19820395054 申请日期 1982.01.27
申请人 N.V. PHILIPS'GLOEILAMPENFABRIEKEN 发明人 MARIEEN, HENDRICUS C.J.;THOMPSON, MICHAEL N.
分类号 H01J37/244;H01J37/26;(IPC1-7):H01J37/26 主分类号 H01J37/244
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