发明名称 TESTING METHOD OF ELECTRIC CIRCUIT
摘要 PURPOSE:To execute efficiently a test by connecting a circuit to be tested to a testing circuit without removing a CPU by a connector and resetting the CPU of the circuit to be tested and opening electrically its all path lines and operating the circuit to be tested with a CPU of the testing circuit. CONSTITUTION:A circuit 12a to be tested has a CPU11, a ROM20, a RAM21, and other circuits. A testing circuit 14a has a CPU15, an ROM22, an RAM23, a reset signal circuit 19, and other circuits. When a substrate 12 of the circuit to be tested and a substrate 14 of the testing circuit are connected, the circuit 19 of the testing circuit 14a gives forcibly a reset signal to a reset terminal of the CPU11 through a path line 18 to open all paths of the CPU11. Then, the CPU15 is operated instead of the CPU11 to test operations of the circuit 12a to be tested. Consequently, it is unnecessary to remove the CPU of the circuit to be tested and to take malfunction of the CPU into consideration, and the efficiency of the test is improved.
申请公布号 JPS60125574(A) 申请公布日期 1985.07.04
申请号 JP19830233438 申请日期 1983.12.10
申请人 MATSUSHITA DENKO KK 发明人 SAKAI HIROSHI;MASUO YASUHISA;KONDOU TATSUO
分类号 G01R31/28;G06F11/273 主分类号 G01R31/28
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