发明名称 Apparatus for treating a sample by a pulsed electron beam
摘要 The invention relates to an apparatus for treating samples comprising in a vacuum enclosure a cathode, an actual anode and a grid, as well as means for supplying the sample to the enclosure, a high voltage generator, a capacitor C1 charged by way of the said generator, a spark gap switch for producing a high energy pulse between the cathode and the grid, said switch being connected to one terminal of said capacitor, an element for producing pulses controlling the spark gap switch and a capacitor C2 having a capacitance above that of capacitor C1, charged by way of the generator used for producing between the actual anode and the cathode an electric field for accelerating and extracting electrons used for the bombardment of the sample.
申请公布号 US4527044(A) 申请公布日期 1985.07.02
申请号 US19820370386 申请日期 1982.04.21
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 BRUEL, MICHEL;FLOCCARI, DECEASED, MICHEL;MICHAUD, JEAN-FRANCOIS
分类号 H01L21/265;H01J37/24;H01J37/305;(IPC1-7):B23K15/00;B23K9/00 主分类号 H01L21/265
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