发明名称 METHOD OF LASER ANNEALING OF SUBSURFACE ION IMPLANTED REGIONS
摘要 <p>A METHOD OF LASER ANNEALING OF SUBSURFACE ION IMPLANTED REGIONS A method for annealing ion implanted regions buried in a semiconductor substrate without the undesirable effects of thermal diffusion which includes the radiation of the substrate by a continuous laser having an emission frequency longer than 600 nanometers which the buried ion implanted regions will absorb strongly but which will be substantially unabsorbed by the unimplanted regions. Superior results can be obtained when the substrate is heated to approximately 300.degree. during this laser annealing.</p>
申请公布号 CA1189768(A) 申请公布日期 1985.07.02
申请号 CA19820404043 申请日期 1982.05.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人
分类号 H01L21/428;H01L21/268;H01L21/74 主分类号 H01L21/428
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