Process and device for system characterization by spectral analysis

摘要

A pseudo-random measuring signal whose spectrum is constituted by lines of predetermined frequencies spaced apart from each other is applied to a system to be characterized, and one or, successively and one by one, a plurality of lines of the spectrum of the measuring signal are selected for making a comparison in phase and amplitude between the input and the output of the system; for a non-linear system, one or, successively and one by one, a plurality of lines of the spectrum of the measuring signal are eliminated at the input of the system, and the phase and/or amplitude of the corresponding line is measured at the output of the system.