| 摘要 |
A circuit test system using signature analysis allows random probing to detect faults in an assembly under test. Test points on a properly working assembly are probed at random and the signatures obtained are listed in a memory or storage media. Thereafter, when testing other boards these same test points are probed randomly and the signatures are compared to the list of possible good signatures. If a match is found a "pass" indication is generated and the operator tests another node. If a match is not found, a "failure" indication is generated and more detailed troubleshooting of circuits at that test node commences.
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