| 摘要 |
PURPOSE:To extract easily an untested area by inputting a signal from a counter and a program area setting circuit to a coverage rate operating circuit to operate to which degree the program is convered during test conduction thereby discriminating clearly the test end period. CONSTITUTION:A memory control circuit 4 writes information ''1'' on the same address location of a RAM5 according to address information and also increments a counter 6 by 1 only when the original information of the same address location on the RAM6 is logical 0. Then a coverage rate operating circuit 7 operates to what degree the program is covered by the test by using inputs from the counter 6 and a program area setting circuit 8. The result of operation is displayed always on an output device 12. Furthermore, the RAM5 is reference to all addreses of the address area set by the circuit 8 and when the content is ''0'', it is discriminated (9) as an unpassed address and the device 12 gives an output. The dynamic analysis of the program is conducted by the output data and a test data passing through the unpassed address is added. |
