发明名称 FORMING METHOD OF BIPOLAR TRANSISTOR IN COMPLEMENTARY METAL INSULATOR SEMICONDUCTOR PROCESS
摘要 PURPOSE:To form a bipolar transistor in a CMOS process having no Ic dependency, a large hFE and good high frequency characteristic by adding a P<+> type diffused layer for newly forming a base without forming a P<-> type well. CONSTITUTION:N-channel and P-channel MOS transistors are formed on an N type silicon substrate 20. In other words, after a window is opened at an oxide film such as an SiO2 oxide film 21, boron ions are implanted to form a base diffused layer 22. The diffusing depth and the density of the base layer at this time are set to levels used for a normal bipolar LSI. Then, an oxide film such as an SiO2 oxide film 23 is formed, a window for diffusing an emitter is opened, phosphorus or arsenic ions are then implanted to form an emitter region 24. A base leading high density P<+> type region 25 and an emitter leading electrode 26 are similarly formed in the CMOS process. An emitter electrode 26 is formed, for example, of polysilicon.
申请公布号 JPS60120563(A) 申请公布日期 1985.06.28
申请号 JP19830228410 申请日期 1983.12.05
申请人 HITACHI SEISAKUSHO KK 发明人 ODAKA MASANORI;MIYAOKA SHIYUUICHI;OGIUE KATSUMI
分类号 H01L29/73;H01L21/331;H01L21/8232;H01L27/06;H01L29/72;H01L29/732 主分类号 H01L29/73
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