| 摘要 |
PURPOSE:To reduce manufacturing costs, in a testing apparatus wherein a testing load such as a bending load is applied to a test piece, by separating a test- piece holding jig and a supporting table, and assembling the holding jig to the supporting table so that the jig can be removed. CONSTITUTION:A test piece TP is heated to a preset temperature by a high temperature furnace 1. Thereafter, a cross head 10 is lowered. A punch 2 is lowered as a unitary body with a loading rod 8, a load cell 9, and the head 10. Thus a bending load is applied to the test piece TP. Then, bend supporting points 5 and a supporting point jig 4 receive the reaction of the benging load, and the test piece TP is deformed between the bend supporting points 5 and 5. When the test is finished, a feed screw 15 is rotated by a handle 14, and the supporting jig 4, a supporting table 3, a holding jig 12, and a moving table 11 are moved as a unitary body. Therefore, the bending test can be conducted continuously. |
