| 摘要 |
<p>PURPOSE:To measure reflected infrared absorption spectrum free from atmospheric effect of measurement, by alterating spectrum measurements by an infrared ray polarized vertically to the incident surface and an infrared ray polarized in parallel and measuring the ratio of these measurements. CONSTITUTION:An infrared ray from a source 1 is led to an interferometer, its output is subjected to linear (plane) polarization by a linear polarizer 3 and the polarized light is led to a polarization modulator 4. The modulator 4 is controlled by a micro-computer 12 and a polarizing plane of the input light modulates the polarizing plane in horizontal as well as vertical directions alternatingly with respect to a specimen surface. The infrared ray thus interfered, polarized and modulated is irradiated to the specimen 5 through a steep angle. The infrared ray reflected by the specimen is detected by a detector 6 and delivered to a processing unit A. The processing unit measures alternatingly a spectrum corresponding to vertical and parallel polarized rays and amplifies them by amplifiers 10, 11 respectively and the ratio is calculated by a micro-computer 12.</p> |
