发明名称 POSITIONAL SHIFT DETECTION DEVICE FOR CHARGED PARTICLE BEAM
摘要 PURPOSE:To make positioning efficient by vidually detecting the positional shift between a charged particle beam axis and the central axis of an electro-optic system at two or more places in the axial direction of a vacuum container central axis that connects a beam source and a target, from the outside of the vacuum container. CONSTITUTION:A laser oscillator 23 is oscillated and a laser beam 28 is guided to a vacuum chamber 15 from a window 20 by adjusting mirrors 21 and 22 and then is reflected by a mirror 19. In addition, its optical axis is aligned with the central axis of an electro-optic system by adjusting a manipulator 18. When they are aligned, the positional shift of a beam axis can visually be detected observing from windows 24 to 26 that the tip of the laser beam 28 reaches any portion of an ion source 1 side while peeping into the inner part of a vacuum chamber 15.
申请公布号 JPS60115138(A) 申请公布日期 1985.06.21
申请号 JP19830220635 申请日期 1983.11.25
申请人 HITACHI SEISAKUSHO KK 发明人 YAMAGUCHI HIROSHI;MIYAUCHI TAKEOKI
分类号 H01J37/04;H01J37/02;H01J37/30 主分类号 H01J37/04
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