发明名称 MASK DEFECT INSPECTION APPARATUS
摘要 PURPOSE:To execute automatic exchange of a plurality of masks for continuous inspection of mask and efficiently load or unload the mask one by one by providing single-mask taking-up mechanism which receives a mask at the predetermined position and sends it to the transfer mechanism. CONSTITUTION:A transfer mechanism 31 consisting of conveyor, etc. is provided between a stage 3 and a mask holder 2 and a every mask taking mechanism which sets or resets the mask 1 on a belt of transfer mechanism 31 is provided at the center of transfer mechanism 31. In the case of executing defect inspection of a plurality of masks 1, a desired mask is selected from a plurality of masks 1, it is pushed on the belt of transfer mechanism 31 by a pushing arm 33 and then transferred on the stage 3. Finally it is set on the predetermined position on the stage 3 by the moving mechanism 32. The mask 1 being set is set to the defect inspection using a device indicated in the figure. The mask 1 completing the inspection is returned to the vacant region in the holder 2 by the transfer mechanism 31 and another mask 1 is selected. Transfer, defect inspection and retransfer of masks 1 are carried out by the similar operations.
申请公布号 JPS60115223(A) 申请公布日期 1985.06.21
申请号 JP19830222855 申请日期 1983.11.26
申请人 TOSHIBA KIKAI KK 发明人 IWASE AKIRA;NUMAGA TAKUOKI;NINOMIYA MASAHARU
分类号 G01N21/88;G01N21/93;G01N21/956;G03F1/84;G03F1/86;H01L21/027;H01L21/66 主分类号 G01N21/88
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