发明名称 SEMICONDUCTOR DEVICE PAD AREA PROTECTION STRUCTURE
摘要 Semiconductor device structure comprising a metalization pattern (16) having a pad area (18). The structure provides protection to the pad area (18) from attack by a corrosive environment. The structure comprises a semiconductor body (10) having a first surface (12), there being a first layer (14) of dielectric material (14) covering at least a portion of the first surface (12). A metalization pattern (16) having a pad area (18) covers a portion of the first layer (14) of dielectric material (14). Access pad structure (20 (22, 40, 44)) covers the pad area (18) for providing an access pad (20) and for protecting the pad area (18) from attack by a corrosive environment. The access pad structure (20 (22, 40, 44)) comprises conductive material (40, 44) impervious to attack by the corrosive environment.
申请公布号 WO8502715(A1) 申请公布日期 1985.06.20
申请号 WO1984US01967 申请日期 1984.12.03
申请人 HONEYWELL INC. 发明人 HOLMEN, JAMES, O.;WURM, MARK, A.
分类号 H01L23/48;H01L23/485;H01L23/532;(IPC1-7):H01L23/48;H01L29/62;H01L29/46 主分类号 H01L23/48
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