发明名称 |
Automatic test equipment. |
摘要 |
<p>An in-circuit automatic test equipment has several channel control arrays (20), each of which can supply test signals to or receive output signals from a unit under test (16) via any one of 8 test nails (14) per array, selected by relays (18). In addition, second and third relays (44, 46) connected to each nail permit currently unselected nails to be used to apply guard signals elsewhere in the UUT.</p> |
申请公布号 |
EP0145194(A1) |
申请公布日期 |
1985.06.19 |
申请号 |
EP19840307280 |
申请日期 |
1984.10.23 |
申请人 |
MEMBRAIN LTD |
发明人 |
LELIEVRE, DAVID HOWARD;BRAZIER, KEVIN EDWARD |
分类号 |
G01R31/28;G01R31/319;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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