发明名称 PHASE ANALYZING METHOD OF EDDY CURRENT EXAMINATION
摘要 PURPOSE:To discriminate various factors concerning defects and surface conditions by obtaining an amplitude and a phase from a phase detection output and obtaining a defect depth, an aperture angle, and a depth direction on a basis of a defect distribution on a preliminarily set amplitude-phase plane with respect to a maximum amplitude point in a series of sections which exceed a specific threshold. CONSTITUTION:An amplitude A and a phase theta are obtained from phase detection outputs QX and QY of a flaw detector in accordance with formulas I and II, and a point Pmax where the amplitude A is maximum is detected from a series of points exceeding the preliminarily set threshold, and an indication 2 which does not exceed the threshold is removed from discrimination object. Values Amax and thetamax of the amplitude A and the phase theta at the point Pmax are obtained in accordance with formulas I and II. These values Amax and thetamax are applied to a factor-classified distribution chart C on the preliminarily set amplitude-phase plane to discriminate factors of the indication on a basis of the position.
申请公布号 JPS60113146(A) 申请公布日期 1985.06.19
申请号 JP19830221879 申请日期 1983.11.24
申请人 KOBE SEIKOSHO KK 发明人 IWASAKI MASAYOSHI;NISHIMOTO YOSHIROU;YASUKUNI HIROAKI
分类号 G01N27/90 主分类号 G01N27/90
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