APPARATUS FOR PHYSICAL PROPERTIES MEASUREMENTS AT HIGH TEMPERATURES AND PRESSURES

摘要

"APPARATUS FOR PHYSICAL PROPERTIES MEASUREMENTS AT HIGH TEMPERATURES AND PRESSURES" An apparatus is disclosed for measuring physical properties of a sample material at controllable temperatures and pressures. The apparatus includes a sample cell for holding fluid and/or solid samples. The cell includes at least one optically transparent window permitting visual and electromagnetic energy observations of the sample. A probe functions within the cell to collect a subsample for movement to apparatus for measuring properties and for returning the subsample to the cell. One form of optically transparent window is a sapphire. The cell is intended for measurements of physical properties at temperatures from about -40.degree.F to about +400.degree.F and at pressures from vacuum to at least 20,000 pounds per square inch.