发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To efficiently keep the junction temperature of a heat-generating element below its maximum rated operating temperature so as to attain higher density and integrity by a method wherein a low-melting point metal with high thermal conductivity is so arranged as to be in contact with the rear side of a wiring substrate. CONSTITUTION:Several heat-generating semiconductor devices 2 are installed on a wiring substrate 1 and are sealed airtight by means of a metal cap 3 whose thermal expansion factor is roughly equal to that of the wiring substrate 1. A weld link 7 whose thermal expansion factor is roughly equal to that of the wiring substrate 1 is attached securely to the periphery of the rear side of the wiring substrate 1 by means of silver solder 6 or the like and the circumference of a metal dish 8 is attached thereto. The gap between the metal dish 8 and wiring substrate 1 is filled with low- melting point metal 9 that contacts the rear side of the wiring substrate 1 uniformly. When the wiring substrate 1 is exposed to temperatures generated by the semiconductor devices 2 that are higher than the melting point of the low-melting point metal 9, the low-melting point metal 9 absorbs the heat and goes molten so that the temperatures of the wiring substrate 1 and semiconductor devices 2 are lowered to the temperatures near the melting point of the low-melting point metal 9.
申请公布号 JPS60111446(A) 申请公布日期 1985.06.17
申请号 JP19830219128 申请日期 1983.11.21
申请人 TOSHIBA KK 发明人 FUKUOKA YOSHITAKA
分类号 H01L23/36;H01L23/16;H01L23/42 主分类号 H01L23/36
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