发明名称 SKEW MEASURING CIRCUIT AND SKEW MEASURING METHOD
摘要 PURPOSE:To measure exactly a skew between pins of a measuring machine by providing a simple circuit constituted of two selecting circuits and an exclusive OR circuit. CONSTITUTION:The first selecting circuit S1 for inputting two input signal to be selected Sb, Sc, and the first selecting signal Sd for designating to select one of these two input signals is provided. Also, an exclusive OR circuit E0 for inputting a rise and fall designating signal Sa for inverting the polarity of an output signal of the selecting circuit S1 and determining whether it is used an output signal or not, and an output signal of the first selecting circuit S1 is provided. The output signal Sg of the first selecting circuit S1, and the output signal Sh of the exclusive OR circuit are inputted as signals to be selected, the second selecting signal Se for designating to select one of them is inputted, and the selected signal of the input signals to be selected is outputted. In such a way, a skew between pins of a measuring machine is measured exactly by a simple circuit.
申请公布号 JPS60111170(A) 申请公布日期 1985.06.17
申请号 JP19830219011 申请日期 1983.11.21
申请人 NIPPON DENKI KK 发明人 YAMAKAWA SHIGEKI
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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