| 摘要 |
<p>WAVEFORM MATCHING SYSTEM AND METHOD A method and system of matching first and second waveforms, each having identifiable features, for identification purposes, are disclosed. The method includes the steps of obtaining from the first waveforms significant said identifiable features having values and locations with respect to a starting point of the associated said first waveform, with the significant identifiable features being obtained according to predetermined criteria; utilizing values and locations of the significant identifiable features of a first waveform to search in predetermined locations for anticipated corresponding identifiable features in a second waveform; determining the values and locations of the identifiable features, if any, found in the predetermined locations; and comparing the values and locations from the determining step with the values and locations of the significant identifiable features of a first waveform according to second predetermined criteria to determine whether or not the second waveform matches a first waveform. The system includes a data acquisition module for obtaining the significant identifiable features mentioned, and a matching module for utilizing the significant identifiable features of the first waveforms to effect the comparing step mentioned.</p> |
