发明名称 Method for producing PNP type lateral transistor separated from substrate by O.D.E. for minimal interference therefrom
摘要 The invention provides a unique sub-micron dimensioned PNP type transistor and method of making the same, wherein hundreds of such transistors may be fabricated on a single chip with each transistor comprising an active region surrounded by field oxide completely isolating it from the substrate and its effects on operation. Spaced apart slots made in the substrate permit the introduction of orientation dependent etching fluid therein to at least substantially etch semi-arrays of active regions of the substrate away from the substrate except for spaced apart supports therealong. Oxidation serves to support the semi-arrays and subsequent steps directly from the substrate or by webs of oxidation along the tops of the semi-arrays connected to the substrate. The support is necessary while orthogonal slots are provided permitting access to opposed sides of the active regions for doping P+ from each end, which P+ is driven in from both sides to provide an P+NP+ emitter base collector transistor active region to which electrical connections are applied using conventional techniques providing almost complete reduction of the parasitic capacitances and resistances because of the total oxide isolation of the active regions from the substrate.
申请公布号 US4522682(A) 申请公布日期 1985.06.11
申请号 US19820390496 申请日期 1982.06.21
申请人 ROCKWELL INTERNATIONAL CORPORATION 发明人 SOCLOF, SIDNEY I.
分类号 H01L21/306;H01L21/762;H01L21/764;(IPC1-7):H01L21/306;B44C1/22;C03C15/00;H01L29/72 主分类号 H01L21/306
代理机构 代理人
主权项
地址