发明名称 INTEGRATED MEMORY CIRCUIT
摘要 PURPOSE:To shorten the maximum reading-out time by constituting in such a way that parasitic capacity of a data line is decreased when the memory cell away from a WD considerably affected due to delay of a word line is selected. CONSTITUTION:A data line is divided into two data lines D1 and D2, and an N- channel type field effect transistor Q' and a signal line S' are added. Sources QM1, QM2...QMN/2, a drain of the Q' and a precharge circuit PC are connected to the data line D2, and sources QMN/2+1, QMN/2+2...QMN, the drain of the Q' and the data input circuit IO are connected to the data line D1. A lateral traveling decoder CD' is connected to S1, S2...Sn and S', and a gate of the drain of the Q' is connected to the S'. As a result, when a memory cell MC with a small delay of a word line D is selected, it is permitted for information reading from the memory cell to be delayed; therefore the maximum value of reading time of an integrated memory circuit can be made smaller.
申请公布号 JPS60106097(A) 申请公布日期 1985.06.11
申请号 JP19830213036 申请日期 1983.11.12
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 TAKEYA TAKESHI
分类号 G11C11/41;G11C11/34;H01L27/10 主分类号 G11C11/41
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