| 摘要 |
A system and method are disclosed for detecting picture element failures in a multielement array. In a preferred embodiment of the invention the illumination of a reference background by a lamp is controlled by a controlled power supply to be off in a first mode of operation and on in a second mode. During a diagnostic operation, the reference background is scanned by a N element CCD array t provide N reference pixels for each scan during each of the first and second modes of operation. During the first mode, a first error signal is developed for each of the N reference pixels in a first mode scan that is greater than a first reference signal level. During the second mode, a second error signal is developed for each of N reference pixels in a second mode scan that is less than a second reference level. These first and second signals are then respectively utilized by a first counter to store the total number of pixel errors detected in a first preselected scan during the first mode and a second counter to store the total number of pixel errors detected in a second preselected scan during the second mode. The counts of these first and second counters are then utilized in conjunction with address and control signals to selectively store in associated first and second circuits the associated numbers or addresses of the defective elements in the array for each of the first and second modes of operation.
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