发明名称 LIGHT-RESISTANCE TESTING APPARATUS
摘要 PURPOSE:To reduce irregularities in light projection on a test pieces and to make it possible to mount many test pieces at the same time, by providing reflecting mirrors, which reflect arc light into a test piece holding frame, on at least one end of the tubular test-piece holding frame. CONSTITUTION:A specified number of test pieces 6 are attached to the inner surface of a test-piece holding frame 1. The inside of the test-piece holding frame 1 is kept at a specified temperature and humidity. Then a xenon discharge lamp 2 is lighted. The xenon discharge lamp 2 is forcibly cooled by a fan 4, which is driven by a fan driving device 5. The xenon arc 2A is projected on the test pieces 6 through a cylindrical filter 3, and a the light resistance test is performed. At this time, the arc light, which is projected on a point P of the surface of the arbitrary test piece 6A becomes the direct light beam A and the reflected light beams by upper and lower reflecting mirrors 13 and 14. The illuminance distribution curve is flatter than that in the case the upper and lower reflecting mirrors 13 and 14 are not provided, and the projection intensity becomes large.
申请公布号 JPS6097242(A) 申请公布日期 1985.05.31
申请号 JP19830203691 申请日期 1983.11.01
申请人 WAKOMU:KK 发明人 KUSUHARA MASAKI
分类号 G01N17/00;(IPC1-7):G01N17/00 主分类号 G01N17/00
代理机构 代理人
主权项
地址