发明名称 SEMICONDUCTOR ELEMENT AND MANUFACTURE THEREOF
摘要 PURPOSE:To prevent any crystalline defect from happening in a nitrogen-doped n<-> grown layer by a method wherein nitrogen and neutral impurity with larger atomic radius than that of nitrogen having no influence upon impurity concentration is added to an n<->GaP grown layer. CONSTITUTION:A boat comprising a member containing a GaP substrates 12 and GaP solution 17 is mounted in a main furnace. Firstly after heating the main furnace up to specified temperature, a Ga.GaP solution reservoir 18 is shifted in the arrow B direction to drain Ga.GaP solution containing Si and Al in a member 11 forming an n<+> grown layer doped with Si and Al on the substrate 12. Secondly when a reactor is filled with Ar+NH3 gas, an n<-> grown layer with N in the form of GaN added thereto is formed on the N<+> grown layer. At this time, Al with larger atomic radius than that of N is trapped in a distorted crystal part due to smaller atomic radius of N than that of P to prevent any crystalline defect from happening. Successively p<+> grown layer may be continuously formed on the n<+> grown layer.
申请公布号 JPS6095919(A) 申请公布日期 1985.05.29
申请号 JP19830203864 申请日期 1983.10.31
申请人 TOSHIBA KK 发明人 UEKI YUUJIROU
分类号 H01L21/208;H01L33/30 主分类号 H01L21/208
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