| 摘要 |
PURPOSE:To execute a measurement with a high accuracy by detecting a diffraction intensity by a diffraction angle for giving an X-ray invading depth of a thickness of the surface layer or less. CONSTITUTION:A sample is fed to a rotary sample base 12 by an automatic sample replacing device 10, and a diffraction angle is measured by a goniometer 14. A semiconductor X-ray detector 16 detects an intensity of diffracted X-rays emitted from the sample, and its output is inputted to a multiple pulse hight selector 20 through an amplifier 18. A computer 24 calcultes an axial density texture in the surface normal direction of a galvanized layer in accordance with an output of the multiple pulse hight selector 20 and the goniometer 14, outputs a result of calculation to a printer 26 or an X-Y plotter 28, and also gives a necessary command signal to the automatic sample replacing device 10, the rotary sample base 12 and the goniometer 14, etc. |
