| 摘要 |
PURPOSE:To measure exactly unevenness of a light quantity by fixing a light quantity ratio by the first and the second light quantity measuring means placed and fixed on a reference point and a surface to be illuminated, respectively, to ''1'', moving the first light quantity measuring means to an optional point, and measuring a light quantity ratio to be optional point. CONSTITUTION:A surface to be illuminated 45 of a plane 46 is illuminated by a luminous flux 44 which is transmitted through a lens 43 from a light source 41, outputs 31, 32 of light quantity sensors 11, 12 which can move on the surface 45 are supplied to respective light quantity measuring devices 21, 22 for comparison and monitor, respectively, and its outputs 51, 61 are supplied to a magnification adjusting device 73 through a ratio forming device 71. Subsequently, the sensor 11 is placed at a reference point 1 on the surface 45, also the sensor 12 is fixed by setting an optional point on the surface 45 as a monitor point 2, an output 74 of the device 73 is set to ''1'', and next, the sensor 11 is moved to an optional measuring point X on the surface 45, and a ratio of said output to a light quantity in the point 1 is measured. In this way, the light quantity received by the sensors 11, 12 is varied together with the light source 41 and a luminous intensity variation rate. |
