发明名称 |
Probe head arrangement for conductor line testing with at least one probe head comprising a plurality of resilient contacts |
摘要 |
A probe head arrangement for contacting a plurality of closely adjacent conductor lines 2 comprises a minimum of one probe head 3, where a plurality of fingers 4 together with a back 5 are made in one piece of monocrystalline silicon in semiconductor technique. A plurality of such probe heads 3 are composed to form a tester. At the beginning of each test it is determined which fingers 4 are to be, and are not to be placed onto the individual conductor lines 2 of a card 1 to be tested. Subsequently, the short and interruption tests can be implemented after the correlation of finger and probe head addresses with the conductor line addresses.
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申请公布号 |
US4520314(A) |
申请公布日期 |
1985.05.28 |
申请号 |
US19820433341 |
申请日期 |
1982.10.08 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ASCH, KARL;GRESCHNER, JOHANN;KALLMEYER, MICHAEL;KULCKE, WERNER |
分类号 |
G01R1/06;G01R1/073;(IPC1-7):G01R1/06;G01R31/02 |
主分类号 |
G01R1/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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