发明名称 Process and device for the nondestructive measurement of material accumulations or coating thicknesses on dielectric materials, in particular plastic
摘要 A process and apparatus for the non-destructive measurement of the thickness of sheets or hollow bodies made of dielectric materials, such as plactis, makes use of a microwave frequency signal which is fed to an elongated microwave strip line which is placed either close to, or in contact with, the material to be measured, whereby the change in the propagation time of the signal represents the thickness, or the filling factor of the measured material. In the case of hollow bodies the strength of the signal is insufficient to be affected by the wall of the body remote from the conductor, and an advantage of the system is that it can be used to measure plastic materials while in a plastic state while in the process of extrusion.
申请公布号 US4520308(A) 申请公布日期 1985.05.28
申请号 US19820415384 申请日期 1982.09.07
申请人 NIX STEINGROEVE ELEKTRO PHYSIK 发明人 ROHDE, THOMAS;CASPERS, FRIEDHELM
分类号 G01B15/02;(IPC1-7):G01R27/04 主分类号 G01B15/02
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