发明名称 POSITIVE TYPE IONIZATION RADIATION RESIST COMPOSITION
摘要 PURPOSE:To enhance dry etching resistance by incorporting a specified polymer obtained by modifying at least a small part of hydroxy groups of p-hydroxy-alpha- methyl-styrene polymer to aromatic sulfonic acid ester groups. CONSTITUTION:A resist compsn. contains a polymer obtained by modifying at least a small part of hydroxy groups of p-hydroxy-alpha-methylstyrene polymer to aromatic sulfonic acid ester groups represented by formula I in which R is an org. groups of formula II, and m/(m+n) is, preferably, in the range of 0.5-1.0. As a result, a resist compsn. good in dry etching resistance can be obtained without impairing resolution, transmittance, and contrast.
申请公布号 JPS6093430(A) 申请公布日期 1985.05.25
申请号 JP19830200046 申请日期 1983.10.27
申请人 FUJITSU KK 发明人 MIYAGAWA MASASHI;YONEDA YASUHIRO;NISHII KOUTA;FUKUYAMA SHIYUNICHI
分类号 G03F7/20;C08F8/00;C08F8/34;C08F12/24;G03C1/72;G03C5/08;G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/20
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