发明名称 THIN FILM FORMING PROCESS
摘要 PURPOSE:To improve the wiring yield by a method wherein an organic compound soluble inorganic solvent is selected to be coated with a metallic layer by rotary coating process and the coated film is decomposed by thermal energy or photoenergy to form a thin film. CONSTITUTION:A diffusion layer 2 is formed in P type Si substrate 1 and an SiO2 film 3 is formed on the layer 2 while wafers 16 with connecting holes 4 are provided. Ethyl alcohol solution of tungsten hexachloride is dripped on the substrate 1 to be turned. Firstly the substrate 1 is left on a hot plate to evaporate the alcohol. Secondly the substrate 1 is placed in a vacuum chamber 6 filled wit H2 and the substrate 1 is vertically irradiated by CO2 laser under specified pressure of H2 decomposing WCl6 and producing HCl to form a W film 5. Thirdly an Al film 7 is forned by sputtering process. Successively a resist wiring pattern is formed by photolithography while the Al film 7 and the W film 5 may be etched for wiring utilizing the resist wiring pattern as a mask.
申请公布号 JPS6091632(A) 申请公布日期 1985.05.23
申请号 JP19830198311 申请日期 1983.10.25
申请人 TOSHIBA KK 发明人 ARIKADO TSUNETOSHI
分类号 C23C18/12;C23C18/14;H01L21/28;H01L21/285;H01L21/316 主分类号 C23C18/12
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