| 摘要 |
PURPOSE:To attain simply the test of an IC by providing an instruction to transfer the data on an external data register to an instruction register in a test mode, and also using a signal terminal to set a test mode. CONSTITUTION:An IC contains an input terminal TSM for test mode setting signal together with an IR load instruction generator 8 which generates an instruction to be transferred to the instruction register 2 of a data register 5 and a selector 9 which selects the data to be set to the register 2. The selector 9 receives the control of a control circuit 3 which works after receiving the instruction set to the register 2 and the test mode setting signal TSM. Then the selector 9 fetches selectively a program instruction read out of an ROM1, an IR load instruction delivered from the generator 8 or the data which is transferred from the data 5 via a bus 6 and outputs it. |
