| 发明名称 |
Testable time delay |
| 摘要 |
A testable time delay apparatus includes means for testing component operation during any stage of system function and means for continuously monitoring and testing component functions. The device is particularly useful in critical process control applications such as in a nuclear reactor control system.
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| 申请公布号 |
US4519090(A) |
申请公布日期 |
1985.05.21 |
| 申请号 |
US19820402323 |
申请日期 |
1982.07.27 |
| 申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
STACKHOUSE, KENNETH B.;HILL, WILLIAM D. |
| 分类号 |
H03K5/13;G21C17/00;H03K5/135;(IPC1-7):G06F11/00;G06M3/02 |
主分类号 |
H03K5/13 |
| 代理机构 |
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| 主权项 |
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