发明名称 METHOD OF MARKING SEMICONDUCTOR CHIPS, AND MARKED SEMICONDUCTOR CHIP
摘要 <p>1. A process for marking semiconductor chips (1) in respect of at least one specific characteristic, characterised in that in order to provide an electronically detectable marking, at least one conductor path (7) connecting two contact surfaces (2, 3) arranged on the chip surface and which have no connection to a semiconductor structure arranged on the semiconductor chip (1), is severed in dependence upon the characteristic which is to be marked.</p>
申请公布号 EP0066836(A3) 申请公布日期 1985.05.15
申请号 EP19820104795 申请日期 1982.06.01
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHINDLBECK, GUNTER, DIPL.-ING.
分类号 H01L21/66;H01L23/544;(IPC1-7):H01L23/54 主分类号 H01L21/66
代理机构 代理人
主权项
地址