DEVICE FOR HIGH-TEMPERATURE X-RAY DIFFRACTION ANALYSIS,申请号SU19833665772-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	DEVICE FOR HIGH-TEMPERATURE X-RAY DIFFRACTION ANALYSIS
摘要
申请公布号	SU1155924(A2)	申请公布日期	1985.05.15
申请号	SU19833665772	申请日期	1983.11.25
申请人	O KT BYURO S O PROIZV I METALLOFIZIKI AN USSR	发明人	NIKISHIN IGOR V,SU;PETKOV VALERIJ V,SU;UTENKOVA OLGA V,SU;SHOLIN VLADIMIR I,SU
分类号	G01N23/20;(IPC1-7):G01N23/20	主分类号	G01N23/20
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Semiconductor device for converting light and radiations into electricity.

Voltage regulator for CRT electrode supply.

Optical scanning apparatus.

Illumination device for a plate exposing apparatus.

Connection of a brush shunt in an electric motor.

Self-inducting coil.

Switched-current integrator.

Underwater pulse tracking system.

Sectional false floor.

Dispensing device.

Waste collection device.

Method and device for producing a tubular article having a circumferential accumulation of material, and an article produced according to the method.

Printing plate holder for a franking machine.

Ink cartridge system with improved volumetric capacity and method for using the same.

Electronic ballast for a load, for example a discarge lamp.

Communication method and apparatus.

Magneto-optic recording medium.

A tobacco filter material and a method of producing the same.

Image processing apparatus.