Device and process for measuring distortions of a test pattern.

摘要

The device and process measures the geometrical distortions of a test pattern and has a particular application in the field of colour television. The process involves scanning along a reference direction (4 or 5) of the frame displayed by a control device (1) in the image plane (3) of an objective (2). Measurement of the differences between the positions of displayed points and the positions they would occupy in a undistorted test pattern is measured by a linear charge-transfer array which is displaced along one or other of the reference directions. The succession of measurements from these points characterises the qualities of the device generating the test pattern (1). <IMAGE>