发明名称 NON-DESTRUCTIVE INSPECTION BY FREQUENCY SPECTRUM RESOLUTION
摘要 A method of inspecting non-destructively a specimen for examining the presence or absence of a defect in the specimen, in which an ultrasonic wave is emitted from a probe and a reflected wave from the specimen is received by the probe whose output signal is processed to determine the presence or absence of the defect. The signal processing includes steps of extracting characteristic parameters from a frequency spectrum of the ultrasonic echo and comparing the extracted parameter with corresponding experimentally or theoretically determined values. The invention makes it possible to automatically determine discriminatively whether the reflector of the ultrasonic echo is a configured portion, a weld boundary or a defect of a specimen to be inspected.
申请公布号 DE3169659(D1) 申请公布日期 1985.05.09
申请号 DE19813169659 申请日期 1981.06.19
申请人 HITACHI, LTD. 发明人 SUGIYAMA, SAKAE
分类号 G01N29/12;G01N29/34;G01N29/44;G01N29/46;(IPC1-7):G01N29/04 主分类号 G01N29/12
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