发明名称 SYSTEM OCH METOD FOER BESTAEMNING AV YTVIKTEN HOS ETT MATERIAL SOM HAR LAOGT ATOMTAL OCH AER BLANDAT MED ETT MATERIAL MED HOEGRE ATOMTAL.
摘要 The invention relates to an apparatus and a process for determining the relative quantity of a low atomic number material in a mixture of the material and a high atomic number material. The apparatus comprises a first source (16) for directing a first beam of X rays into the mixture, a second source (20) for directing a second beam of X rays into the mixture, a first and a second detectors (34, 36) for detecting respectively the first and second beams in the absence of the mixture and for detecting respectively the portion of the first and second beams transmitted through the mixture. The apparatus also comprises a computer (60) coupled to the first and second detectors to determine, upon the detected beams, the relative quantity of the low atomic number material. Application to the measurement of the concentration of binder material in fiber glass.
申请公布号 FI844351(L) 申请公布日期 1985.05.08
申请号 FI19840004351 申请日期 1984.11.06
申请人 MEASUREX CORPORATION 发明人 HEGLAND, PHILIP;DAHLQUIST, JOHN
分类号 G01N23/06;G01M11/00;G01N23/08 主分类号 G01N23/06
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